The ICMIE conference is the premier interdisciplinary platform for the presentation of new advances and research results in the fields of Measurement Instrumentation and Electronics. The conference will bring together leading academic scientists, researchers and scholars in the domain of interest from around the world.
Topics of interest for submission include, but are not limited to:
I. Instrumentation and Measurement Systems
Electronic instruments and measurement systems
Optical instruments and measurement systems
MEMS instruments and test systems
Precision instruments and measurement systems
Scientific experiment and analytic instruments
Testability and built-in-test
Virtual instruments
VLSI testing and fault diagnosis
II. Data Acquisition and Analysis
Cyber-physical systems
Data acquisition systems and technology
Image processing
Internet of Things (IoT)
Machine learning and pattern recognition
Massive data management and analysis
Measurement error theory
Measurement systems and theory
Networks in test and measurement
Non-electric measurement
Reconfigurable computing and sensor fusion
Sensor networks
Sensors and transducers
Signal analysis and processing
Signal transmission and data bus
Virtual measurement
III. Electronics and Applications
Biomedical electronics
Communication theory and systems
Control theory and applications
Electrical machines and drives
Electrical materials and electromagnetics
Electronics instrumentation
High voltage techniques and microwave
Intelligent systems and sensors
Mechatronics
Multi-robot systems
Optoelectronics
Power electronics and applications
Robotics and automation systems
