The ICMIE conference is the premier interdisciplinary platform for the presentation of new advances and research results in the fields of Measurement Instrumentation and Electronics. The conference will bring together leading academic scientists, researchers and scholars in the domain of interest from around the world.

Topics of interest for submission include, but are not limited to:
会议收稿范围包括但不局限于如下主题:
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Topics | Flyer


*Measurement, Instruments & Test

Virtual Instrument
Scientific Experiment and Analytic Instrument
Educational Instrument & Experimental System
Microprocessor and Embedded System
VLSI Testing and Fault Diagnosis
MEMS Instruments and Test System
Testability and Built-in-test
Electronic Instrument & Measurement System
Optical Instrument & Measurement System
Precision Instruments & Measurement System

*Measurement & Test Information Processing

Measurement System and Theory
Measurement Error Theory
Virtual Measurement
Machine Learning and Pattern Recognition
Massive Data Management and Analysis
Reconfigurable Computing Sensors Fusion
Signal Analysis and Processing
Image Processing

*Measurement & Test Information Acquisition and Transmission

Sensors and Transducers
Non-electric Measurement
Sensor Network
Data Acquisition System and Technology
Signal Transmission and Data Bus
Networks in Test and Measurement
IOT: Internet of Things
Cyber Physical System