2012 International Conference on
Manufacturing and Industrial Engineering - ICMIE 2012
Welcome to the official website of the
2012 International Conference on Manufacturing and Industrial
Engineering, ICMIE 2012, will be held during February 26-28,
2012, in
Singapore. ICMIE 2012, aims to bring together
researchers, scientists, engineers, and scholar students to
exchange and share their experiences, new ideas, and research
results about all aspects of Manufacturing and Industrial
Engineering,
and discuss the practical challenges encountered and the
solutions adopted.
The conference will be held every year to
make it an ideal platform for people to share views and
experiences in Communication and Electronics Information and related areas.
Papers for the ICMIE 2012 will be published in the
IPCSIT (ISSN:
2010-460X) as one volume, and will be included in the Engineering &
Technology Digital Library, and indexed by EBSCO, CNKI (中国知网), WorldCat, Google
Scholar, and sent to be
reviewed by Ei Compendex and ISI Proceedings. Selected papers will be
recommended to be published in the Journals.
Selected papers in Manufacturing will be recommended to be
published in AMR together with ICKEM 2011.
English is the official language of the conference. We
welcome paper submissions. Prospective authors are invited to
submit full (and original research) papers (which is NOT
submitted/published/under consideration anywhere in other
conferences/journal) in electronic (PDF only) format through
the
easy chair conferences management system website or via
email icmie@iacsit.org.
Disclaimer: The content of the website is
subject to change. The information on hyper linked or referred
to web sites is neither investigated nor analyzed by the
conference organizers. No warranty or representation, express
or implied, is given as to the accuracy or completeness of
that information. In no event will the conference organizers
accept any liability with regard to the information contained
in this web site or any other hyper linked or referred to web
sites. | 
